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  • Panel: “Automotive Test and Reliability: How could IEEE1687.2 change our future?”

Panel: “Automotive Test and Reliability: How could IEEE1687.2 change our future?”

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Friday 5
3:45 pm - 4:45 pm
Moderator: Wim Dobbelaere - ON Semiconductor, Belgium

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Keynote: “More Compute Performance under the Hood: New Applications and Complexity Challenges for Automotive Microcontrollers”
Embedded Tutorial: “Memory Testing for Automotive Applications beyond plain Test Quality”

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