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Opening of the first “Automotive Test and Reliability Workshop in Europe 2021”
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Yervant Zorian (Synopsys, USA), Paolo Bernardi, Riccardo Cantoro (Politecnico di Torino, Italy), Wim Dobbelaere (ON Semiconductor, Belgium)
Technical session: “Fault detection, grading, and monitoring techniques”
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Moderator: Davide Appello - STMicroelectronics, Italy
Break
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Technical session: “Test quality and Reliability in Automotive”
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Moderator: Alberto Bosio - Ecole Centrale de Lyon, Lyon Institute of Nanotechnology, France
Offline
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Keynote: “More Compute Performance under the Hood: New Applications and Complexity Challenges for Automotive Microcontrollers”
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Speaker: Dr. Christian Pacha - Infineon Technologies, Germany
Moderator: Paolo Bernardi - Politecnico di Torino
Panel: “Automotive Test and Reliability: How could IEEE1687.2 change our future?”
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Moderator: Wim Dobbelaere - ON Semiconductor, Belgium
Break
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Embedded Tutorial: “Memory Testing for Automotive Applications beyond plain Test Quality”
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Speaker: Dr. Martin Keim - Mentor, a Siemens Business, USA
Moderator: Elena-Ioana Vatajelu - Grenoble INP, TIMA, CNRS, France
Panel: “New automotive design methodologies for catching latent defects and detecting anomalies online”
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Moderator: Haralampos-G. Stratigopoulos - Sorbonne Université, CNRS, LIP6, France
Closing
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