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  • Embedded Tutorial: “Memory Testing for Automotive Applications beyond plain Test Quality”

Embedded Tutorial: “Memory Testing for Automotive Applications beyond plain Test Quality”

Event Timeslots (1)

Friday 5
5:00 pm - 5:45 pm
Speaker: Dr. Martin Keim - Mentor, a Siemens Business, USA
Moderator: Elena-Ioana Vatajelu - Grenoble INP, TIMA, CNRS, France

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Panel: “Automotive Test and Reliability: How could IEEE1687.2 change our future?”
Panel: “New automotive design methodologies for catching latent defects and detecting anomalies online”

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