Final Program

Thursday 25/05/2023
16:00 – 16:30 CET Opening
16:30 – 17:30 CET Technical Session 1: Application – System-level
17:30 – 18:30 CET Technical Session 2: Analog 

 

Friday 26/05/2023
08:30 – 09:15 CET Keynote
09:15 – 10:00 CET Panel 1
10:00 – 10:30 CET Break
10:30 – 11:30 CET Technical Session 3: Dependability – Testing
11:30 – 12:30 CET Panel 2
12:30 – 13:30 CET Lunch break
13:30 – 15:00 CET Technical Session 4: Reliability – Safety
15:00 – 15:30 CET Closing remarks

 

Thursday 25/05/2023

16:00 – 16:30 CET – Opening

16:30 – 17:30 CET – Technical Session 1: APPLICATION – SYSTEM-LEVEL

Moderator: Anthony Coyette (onsemi)

Presentations:

  • Exploring System-Level Test applications: Arcana, Fallacia and Liberations
    Francesco Angione, Paolo Bernardi, Matteo Sonza Reorda, Davide Appello, Claudia Bertani and Vincenzo Tancorre (Politecnico di Torino, STMicroelectronics)
  • IoT-based Onboard Prognostic Health Evaluation System for Automotive Suspensions
    Bhagawat Baanav Yedla Ravi, Md Rafiul Kabir, Sumaiya Afroz Mila and Sandip Ray (University of Florida)
  • Signal-to-Noise Ratio in LiDAR Assessment for Assisted and Autonomous Driving
    João Aguiar, José Machado Da Silva and Miguel Correia (Universidade do Porto, INESC TEC)

17:30 – 18:30 CET – Technical Session 2: ANALOG

Moderator: Ralf Arnold (Infineon)

Presentations:

  • Case study of Fault Simulations with an Automotive Mixed Signal IP 
    Shivakumar Chonnad, Radu Iacob, Kirankumar Karanam and Nitin Bansal (Synopsys)
  • Discussing Trends for Fault-Injection Support in Analog Hardware Description Languages
    Renaud Gillon, Nicola Dall’Ora, Sadia Azam, Enrico Fraccaroli and Franco Fummi (University of Verona)
  • IEEE 1687/1687.2: Overview of an Industrial Implementation going for Test Reuse, Analog Test Verification and Validation 
    Anthony Coyette, Peter Bauwens, Ronny Vanhooren, Wim Dobbelaere, Erik Ruttens, Marek Hustava, Georges Gielen and Jhon Gomez (onsemi)

Friday 26/05/2023

08:30 – 09:15 CET – Keynote

Smart on Chip Sensors as Game Changer for Automotive IC Quality and Innovation

Keynoter: Heinz Wagensonner (Quality Lead Semiconductors, CARIAD)

Moderator: Yervant Zorian (Synopsys)

09:15 – 10:00 CET – Panel

On chip monitoring: just an additive or the next revolution of test methods? 

Moderator: Davide Appello (STMicroelectronics)

Panelists:

  • Claudia Bertani (STMicroelectronics)
  • Heinz Wagensonner (Cariad Technology)
  • Yervant Zorian (Synopsys)

Abstract:

Nowadays it is very hard to compile an exhaustive list of the possible uses for on-chip monitors and sensors. They are at the basis of a concept often called health and performance monitoring, an emerging field in lifecycle management of complex compute systems. Our panelists will explore more possibilities around this concept and indicate the challenges or obstacles we will have to overcome to reap the full benefits of this approach. Beside this, they will elaborate about two of the specific cycles in the life of a product:

  1. Will data extracted from on-chip monitors be able to avoid some of the tests in the long list we are currently managing?
    1. DC/parametric? Speed binning? Interconnect tests?
    2. Will they be cost “competitive” in respect to legacy methods?
  1. Sensors and monitors testing: what will be in common between EOL and in-field?
    1. How can we determine during mission-mode is there is an issue?
    2. Will “test limits” in-field be adaptive (per chip) or global?
    3. Should we feed-forward information from EOL to the field and backwards, to be more effective?
    4. What impact will this have on FuSa monitoring?

10:30 – 11:30 CET – Technical Session 3: DEPENDABILITY – TESTING

Moderator: Marco Restifo (ARM)

Presentations:

  • Mitigating Soft Error Impact on System Dependability
    Ghani Kanawati (ARM)
  • Capacitive Testing- the Game Changer that revolutionizes the semiconductor industry
    Leslie Khoo (STMicroelectronics)
  • Regions of Machine-Learning Supremacy: an Industry Perspective on automotive post-Si Verification
    Thomas Nirmaier, Manuel Harrant, Wendy You, Jonas Stricker, Behnam Beladi and Georg Pelz (Infineon)

11:30 – 12:30 CET – Panel

Automotive Test, Reliability and Safety: How could Analog BIST change our future? 

Moderator: Wim Dobbelaere (onsemi)

Panelists:

  • Stefano Roggi (Infineon Austria)
  • Giuseppe Rumi (STMicroelectronics)
  • Anthony Coyette (onsemi)
  • Carlo Protti Melano (Allegromicro)
  • Professor Erik Larsson (Lund University)

Abstract: Built-in self-test has become the industry standard to enable high quality DIGITAL integrated circuits to be tested at very low cost. Moreover, the BIST approach allows for automotive circuits to enhance safety and reliability through continuous testing during the lifetime of the product. In contrast, ANALOG and mixed-signal integrated circuits are usually tested in a semi-manual, empirical way using parametric measurements by Automated Test Equipments. The advent of analog BIST architectures is enabling similar benefits for analog and mixed-signal circuits: lower test cost through improved parallelism, improved quality by using a structural approach (e.g., IEEE 1687.2), and improved safety and reliability by creating test modes during the active life of the product.

13:30 – 15:00 CET – Technical Session 4: RELIABILITY – SAFETY

Moderator: Alessandra Nardi (Synopsys)

Presentations:

  • THB effectiveness study in TE-FCBGA for Automotive applications
    Edoardo Mariani, Stefano Testa, Luca Cola and Luigi Iannacci (STMicroelectronics)
  • Have We All Fallen Behind in Qualifying Intrinsic Reliability in PPM To Meet the PPB Expectation for Automotive Semiconductors?
    Lieyi Sheng (onsemi)
  • HSR (Hardware Safety Requirements) verification during development: how deep do we have to go?
    Carlo Protti Melano, Damiano Cuomo (Allegromicro)
  • Functional Safety and Cybersecurity Solutions
    Marco Restifo, Luca Di Mauro and Pete Harrod (ARM)

15:00 – 15:30 CET – Closing remarks