All times are CET

Thursday, May 29th, 2025

Friday, May 30th, 2025

9:00 – 10:00	Keynote 2
10:00 – 10:20	Coffee Break
10:20 – 11:00	Technical Session 1
11:00 – 11:45	Automotive Hardware: ATE and Probe solutions
11:45 – 12:15	Automotive at Volvo Trucks
12:15 – 13:30	Lunch Break
13:30 – 14:15	Technical Session 2
14:15 – 15:15	Cell-aware Vstress in Automotive
15:15 – 15:30	Coffee Break
15:30 – 16:00	Automotive in Estonia
16:00	Closing

16:30 – 16:45  Opening

Yervant Zorian (Synopsys, US)
Davide Appello (Technoprobe, IT)
Anthony Coyette (onsemi, BE)
Giusy Iaria (Politecnico di Torino, IT)

Self presentations by the audience!

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16:45 – 17:30 Keynote 1

The next stops for Automotive reliability and safety
Juergen Alt (Infineon, DE)

Abstract: The automotive industry is undergoing a significant transformation, driven by the growing demand for electrification, advanced driver-assistance systems (ADAS), and software-defined vehicles. As a result, the need for microelectronic components in cars is increasing significantly.

At the same time, the way people interact with their vehicles is changing, leading to new use models for car electronics. This shift presents a substantial business opportunity for automotive semiconductor suppliers, but it also brings unique challenges. To address these challenges, the industry must take innovative steps to ensure the quality, reliability, and safety levels for the electronic systems of future cars.

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17:30 – 18:30 Panel

Moderated by Davide Appello (Technoprobe, IT)

Future Trends in Automotive

Panelists:

• Peter Thorngren (Volvo Trucks)
• Juergen Alt (Infineon)
• Thomas Koehler (Teradyne)
• Riccardo Cantoro (Politecnico di Torino)
• Lee Harrison (Siemens EDA)

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18:30 Welcome Cocktail

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Friday, May 30th, 2025

9:00 – 10:00 Keynote 2 (in conjuction with AI-TREATS)

Is AI Becoming a Good Driver? Reliability Issues in Artificial Neural Networks and Potential Solutions for Autonomous Vehicles
Paolo Rech (University of Trento, IT)

Abstract: Driverless cars are the new trend in the automotive market and, to burst deep space exploration, NASA and ESA are willing to add self-driving capabilities to their rovers. Ingenuity, landed in Mars in 2021, is the first autonomous vehicle to move outside of the Earth. To be implemented, a self-driving system needs to analyze a huge amount of images and signals in real time. This is achieved thanks to Convolutional Neural Networks (CNNs) executed on Graphics Processing Units (GPUs), dedicated accelerators implemented in Field Programmable Gate Arrays (FPGAs) or in Application Specific Integrated Circuits (ASICs), such as the Google’s Tensor Processing Unit (TPU), or even in emerging architectures such as Processing In Memory (PIM) or Neuromorphic devices. In the talk, after a brief description of radiation effects at physical level, we will investigate the reliability of modern and emerging computing architectures executing neural networks, we will show if and why a neutron-induced corruption can modify the autonomous vehicles behaviors, and discuss the implications of these corruptions for the adoption of self-driving vehicles in large scale.
The evaluation, to be accurate and precise, is based on the combination of beam experiments and fault injection at different levels of abstractions (RTL, microarchitectural, and software). This combination allows us to have a realistic evaluation of the error rate, distinguish between tolerable errors and critical errors, and to design efficient and effective hardening solutions for neural networks. Exploiting the potential of machine learning and taking full advantage of the computing resources in modern accelerators it is possible to significantly improve the neural network reliability with nearly-zero overhead.

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10:00 – 10:20 Coffee Break

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10:20 – 11:00 Technical Session 1

Moderator: Giusy Iaria (Politecnico di Torino)

1. Optimization of Test Insertions in Semiconductor Manufacturing Using Reinforcement Learning

Salim Benhamadi (University Of Padova), Alin Alexandru Caluseriu (Infineon), Giorgia Cassetta (Infineon), Marco D’Acunzo (Infineon), Marius Sorin Neagoe (Infineon) and Mihai Popovici (Infineon)

2. Automated Semiconductor Test Data Analysis Using a Hybrid Deep Learning Pipeline

Salim Benhamadi (University Of Padova), Massimo Pierobon (Infineon), Giorgia Cassetta (Infineon) and Sabrina Santirosi (Infineon)

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11:00 – 11:45 Automotive Hardware: ATE and Probe solutions

Moderator: Piet Engelke (Infineon)

Automotive Hardware: ATE and Probe solutions

Presenters: Thomas Koehler (Teradyne), Davide Appello (Technoprobe)

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11:45 – 12:15 Automotive at Volvo Trucks

Moderator: Artur Jutman (Testonica)

Presenter: Peter Thorngren (Volvo Trucks)

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12:15 – 13:30 Lunch break

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13:30 – 14:10 Technical Session 2

Moderator: Giusy Iaria (Politecnico di Torino)

1. Selecting ROs Modules with Grouped Regularization for Automotive MCU Performance Screening

Nicolò Bellarmino (Politecnico di Torino), Riccardo Cantoro (Politecnico di Torino), Martin Huch (Infineon), Tobias Kilian (TU Munich) and Giovanni Squillero (Politecnico di Torino)

2. Robust Logic Built-In Self-Test for Automotive Electronics under PVT Variations

Hanieh Jafarzadeh (Paderborn University), Sybille Hellebrand (Paderborn University) and Hans-Joachim Wunderlich (University of Stuttgart)

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14:10 – 15:15 Cell-Aware Vstress in Automotive

Moderator: Anthony Coyette (onsemi)

Cell-Aware Vstress in Automotive

Presenters: Andreas Glowatz (Siemens), Piet Engelke (Infineon)

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15:15 – 15:30 Coffee Break

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15:30 – 16:00 Automotive in Estonia

Moderator: TBA

Title: Auve Tech’s Autonomous Mobility Platform: From Concept to Deployment

Presenter: Andreas Rebane (CTO at Auve Tech)

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16:00 Closing

Yervant Zorian (Synopsys, US)
Davide Appello (Technoprobe, IT)
Anthony Coyette (onsemi, BE)
Giusy Iaria (Politecnico di Torino, IT)