All times are CET
Thursday, May 29th, 2025
| 16:30 – 16:45 | Opening |
| 16:45 – 17:30 | Keynote 1 |
| 17:30 – 18:30 | Panel |
| 18:30 | Welcome Reception |
Friday, May 30th, 2025
| 8:30 – 9:30 | Keynote 2 |
| 10:00 – 10:30 | Coffee Break |
| 10:30 – 11:30 | Technical Session |
| 11:30 – 12:15 | Invited talks 1 |
| 12:15 – 13:45 | Lunch Break |
| 13:45 – 15:45 | Invited talks 2 |
| 15:45 | Closing |
Thursday, May 29th, 2025
16:30 – 16:45 Opening
Yervant Zorian (Synopsys, US)
Davide Appello (Technoprobe, IT)
Anthony Coyette (onsemi, BE)
Giusy Iaria (Politecnico di Torino, IT)
Self presentations by the audience!
16:45 – 17:30 Keynote 1
The next stops for Automotive reliability and safety
Juergen Alt (Infineon, DE)
Abstract: The automotive industry is undergoing a significant transformation, driven by the growing demand for electrification, advanced driver-assistance systems (ADAS), and software-defined vehicles. As a result, the need for microelectronic components in cars is increasing significantly.
At the same time, the way people interact with their vehicles is changing, leading to new use models for car electronics. This shift presents a substantial business opportunity for automotive semiconductor suppliers, but it also brings unique challenges. To address these challenges, the industry must take innovative steps to ensure the quality, reliability, and safety levels for the electronic systems of future cars.
Juergen Alt is Senior Principal Engineer at Infineon. Within Infineon’s architecture group for Automotive Microcontrollers, he is responsible for test concept and Design-for-Test architecture of next generation microcontroller platform. He is in business for 25+ years working on Design & Test, Electronic Design Automation and reliability topics for Intel and Infineon. He contributed to various university and industry collaboration projects. At Friedrich-Alexander University Erlangen, Germany he is lecturer for DfT courses, and he contributed to multiple conferences by regular presentations. Juergen is based in Munich, Germany and has diploma and doctoral degrees in electrical engineering both from University of Hannover, Germany.
17:30 – 18:30 Panel
18:30 Welcome Cocktail
Friday, May 30th, 2025
9:00 – 10:00 Keynote 2 (in conjuction with AI-TREATS)
Is AI Becoming a Good Driver? Reliability Issues in Artificial Neural Networks and Potential Solutions for Autonomous Vehicles
Paolo Rech (University of Trento, IT)
Abstract: Driverless cars are the new trend in the automotive market and, to burst deep space exploration, NASA and ESA are willing to add self-driving capabilities to their rovers. Ingenuity, landed in Mars in 2021, is the first autonomous vehicle to move outside of the Earth. To be implemented, a self-driving system needs to analyze a huge amount of images and signals in real time. This is achieved thanks to Convolutional Neural Networks (CNNs) executed on Graphics Processing Units (GPUs), dedicated accelerators implemented in Field Programmable Gate Arrays (FPGAs) or in Application Specific Integrated Circuits (ASICs), such as the Google’s Tensor Processing Unit (TPU), or even in emerging architectures such as Processing In Memory (PIM) or Neuromorphic devices. In the talk, after a brief description of radiation effects at physical level, we will investigate the reliability of modern and emerging computing architectures executing neural networks, we will show if and why a neutron-induced corruption can modify the autonomous vehicles behaviors, and discuss the implications of these corruptions for the adoption of self-driving vehicles in large scale.
The evaluation, to be accurate and precise, is based on the combination of beam experiments and fault injection at different levels of abstractions (RTL, microarchitectural, and software). This combination allows us to have a realistic evaluation of the error rate, distinguish between tolerable errors and critical errors, and to design efficient and effective hardening solutions for neural networks. Exploiting the potential of machine learning and taking full advantage of the computing resources in modern accelerators it is possible to significantly improve the neural network reliability with nearly-zero overhead.
Paolo Rech received his master and Ph.D. degrees from Padova University, Padova, Italy, in 2006 and 2009, respectively. He was then a Post Doc at LIRMM in Montpellier, France. Since 2022 Paolo is an associate professor at Università di Trento, in Italy and since 2012 he is an associate professor at UFRGS in Brazil. He is the 2019 Rosen Scholar Fellow at the Los Alamos National Laboratory, he received the 2024 Italy-Canada innovation award, the 2020 impact in society award from the Rutherford Appleton Laboratory, UK and the Marie Curie Fellowship at Politecnico di Torino, in Italy. His main research interests include the evaluation and mitigation of radiation-induced effects in autonomous vehicles for automotive applications and space exploration, in large-scale HPC centers, and quantum computers.
10:00 – 10:30 Coffee Break
10:30 – 11:30 Technical Session
Moderator: TBA
- Optimization of Test Insertions in Semiconductor Manufacturing Using Reinforcement Learning
Salim Benhamadi (University Of Padova), Alin Alexandru Caluseriu (Infineon), Giorgia Cassetta (Infineon), Marco D’Acunzo (Infineon), Marius Sorin Neagoe (Infineon) and Mihai Popovici (Infineon)
2. Automated Semiconductor Test Data Analysis Using a Hybrid Deep Learning Pipeline
Salim Benhamadi (University Of Padova), Massimo Pierobon (Infineon), Giorgia Cassetta (Infineon) and Sabrina Santirosi (Infineon)
3. Selecting ROs Modules with Grouped Regularization for Automotive MCU Performance Screening
Nicolò Bellarmino (Politecnico di Torino), Riccardo Cantoro (Politecnico di Torino), Martin Huch (Infineon), Tobias Kilian (TU Munich) and Giovanni Squillero (Politecnico di Torino)
11:30 – 12:15 Invited talks 1
Moderator: TBA
Automotive ATE
Presenters: Thomas Koehler (Teradyne), Davide Appello (Technoprobe)
12:15 – 13:45 Lunch break
13:45 – 15:45 Invited talks 2 – Problem solving in teams!
Moderator: TBA
Cell-Aware Vstress in Automotive
Presenters: Andreas Glowatz (Siemens), Piet Engelke (Infineon)
15:45 Closing
Yervant Zorian (Synopsys, US)
Davide Appello (Technoprobe, IT)
Anthony Coyette (onsemi, BE)
Giusy Iaria (Politecnico di Torino, IT)