Wim DOBBELAERE is Senior Director of Test & Product Engineering in the Automotive Product Division of ON Semiconductor. Wim holds a MSEE degree from the University of Illinois at Urbana-Champaign, USA, and a PhD degree in Electrical Engineering from the University of Leuven, Belgium. He is a fellow of the Belgian- American educational foundation and he is the author/co-author of 49 publications and 3 patents. He is actively involved in a research collaboration between the University of Leuven, Belgium and ON Semiconductor, focusing on test coverage improvements for latent defects in automotive applications. He serves in the program committee of the IEEE International Test Conference, the IEEE VLSI Test Symposium and the IEEE European Test Symposium.
