Program-at-a-glance
Preliminary Program
Thursday 14th of October 3:30 PM – 5 PM (PT time)
Opening of the sixth Automotive Reliability, Test and Safety Workshop 2021
General Chairs: Yervant Zorian, Synopsys (US), Davide Appello, STM (IT), Nir Maor, Qualcomm (US) Program Chair: Paolo Bernardi, Politecnico di Torino (I)
Keynote 1: Antonio Priore, ARM (UK)
Title: The Disruption, Transformation & Reinvention of RAMS in the modern world 
Abstract: One of the major challenges for a RAMS (Reliability Availability Maintainability and Safety) engineer has always been that the delivered system, in addition of providing the desired functionalities, does so without affecting critical properties, like the health of the people around it. In the past, these specialists had access and could easily influence the design of a system with the results of their activities because, for highly critical systems, everything was bespoken and expensively designed to fit the purpose. In the engineering as well as in the management community, a ‘perfectly safe fit’ clearly appears as desirable. However, both communities acknowledge that, despite a considerable amount of efforts carried out, the cost of such approach is such that disruptive innovation at scale e.g. autonomous driving, or space colonization would simply not be possible. The world today turned on the provider of COTS (Commercial Off The Shelf) components to reduce cost but still keep the required level of safety of course. This talk aims to explore the ‘headaches’ that such turn of events created on RAMS engineers and how the industrial community responded, as well as providing the author’s vision of the RAMS world going forward.
Short bio:Antonio Priore works for Arm as Director of Functional Safety and Cyber Security(FuSa&CS). He’s the acting Arm Global Functional Safety manager and leads the FuSa&CS Centre of Excellence team, responsible for the definition and continuous improvement of the FuSa&CS processes in Arm. The team is responsible for showing compliance to multiple standards (e.g. ISO 26262, IEC 61508, ISO 21434, IEC 62443, etc.) across different market segments. Antonio is a UK Chartered Engineer and member of the IET, with a career spanning more than a decade in Functional Safety Engineering across different domains like Automotive, Aerospace, Industrial and Railway. He’s author of multiple papers and a member of the British Standard Institute contributing to multiple ISO and IEC standards creation. Antonio holds a Master Degree in Electronic Engineering from the University of Pisa, Italy.
Friday 15th of October 8:00 AM – 9:00 AM (PT time)
Moderator: Riccardo Cantoro, Politecnico di Torino (IT)
Keynote 2: Davide Santo, STMicroelectronics (IT)
Title: Digital Products in the new Mobility Era: New Integration Platform for a smarter, greener and connected World
Abstract: the key note covers the short/long term mobility drivers (Preserve environment, Protect people data, Process efficiently data), with its associated technologies and It then touches new vehicle architectures (Domain to Zone), which are transforming the way our products are conceived, designed and tested presenting at high level new solution proposed by ST to respond to the most recent market requests.
Short bio: Davide Santo graduated EE in Milano where he started working in Optical Networking business and Cell Mobile Phone as Hardware Designer. Moved in early 2000 into Automotive joining Motorola in Munich, later Freescale and NXP, Davide took increasing leadership role in automotive, namely System architect manager, then Product manager before being the General Manager for ADAS mC in Freescale and later NXP. In 2018 he joined ON semiconductor as GM for Radar Sensor Product Line and since 2021 he has join ST Microelectronic as responsible for Automotive Microcontroller Business.
9:00 AM – 9:50 AM (PT time)
Technical Session 1 – In-field Reliability and Hardware Security of Automotive Components and Systems
Moderator: Davide Appello, STMicroelectronics (IT)
Mitigating Soft Errors’ Impact On System Reliability Ghani Kanawati, Magnus Bruce, Teresa McLaurin, Jim Dodrill - ARM ltd, US Jamileh Davoudi, Brian Davenport - Synopsys, US SLAA: Security of Lane Line Detection Algorithms against Adversarial Attack Shelaniece Clash, Olufunmilayo Oyekoya, Rachida Kone, Nnamdi Osuagwu, Onyema Osuagwu, Cliston Cole, Paul S. Wang, Md Tanvir Arafin and Kevin Kornegay Morgan State University, US (Elevator talk) Associating sensor data and reference truth labels: A step towards SOTIF validation of perception sensors Marco Kryda, Minhao Qiu, Mario Berk, Boris Buschardt, Tobias Antesberger, Reinhard German and Daniel Straub Technical University of Munich, DE, Friedrich-Alexander-University of Erlangen-Nuremberg, DE, Audi AG, DE, CARIAD, DE, Technical University of Munich, DE (Elevator talk) Exploring System-level Coordination of Vehicular Electronics: A Case Study for Traction Control Md Rafiul Kabir and Sandip Ray University of Florida, US
9:50 AM – 10:00 AM (PT time)
human factor break
10:00 AM – 10:50 AM (PT time)
Technical session 2 – EDA tools and Testing Technologies
Moderator: Paolo Bernardi, Politecnico di Torino (IT)
PACE: AVF estimation using formal methods Balaji Venu, David Gilday, Angus Logan, Emre Ozer, Kauser Yakub Johar, Spyros Lyberis, Zemian Hughes - ARM ltd, UK Reiley Jeyapaul - Arm Inc Anuraag Narang - University of Liverpool Scalable Tester Architecture for Automotive System on Chip Davide Appello, Ric Dokken, Claudia Bertani, Francesco Camarda, Giorgio Pollaccia, Vincenzo Tancorre and Davide Petrali STMicroelectonics, IT and Roguevation, US (Elevator talk) Selection of Observers and Triggering Features for Reliability Tests Mauro Pipponzi and Alberto Sangiovanni-Vincentelli ELES Semiconductor Equipment, IT, and University of California, Berkeley, US (Elevator talk) Fine-Grained Built-In Self-Repair Techniques for NAND Flash Memories Shyue-Kung Lu and Shi-Chun Tseng National Taiwan University of Science and Technology, TW
10:50 AM – 11:10 AM (PT time)
human factor break
11:10 AM – 12:25 AM (PT time)
Special session on Functional Safety
Moderator: Yervant Zorian, Synopsys (US)
In-System Automotive Test Solution for External Memories Yehonatan Abotbol, Grigor Tshagharyan, Arun Kumar, Gurgen Harutyunyan Intel Mobileye, Synopsys In-System BIST Design Considerations for Automotive Safety Srinivas Patil, Rajesh Tiwari, Ankit Goyal Qualcomm SoC Safety Management and Diagnostics with the ARC Safety Island and SHS/SMS Fergus Casey, Srini Krishnaswami, Karen Darbinyan Synopsys
12:25 AM – 1:30 PM (PT time)
Lunch/Dinner break
1:30 PM – 2:50 PM (PT time)
Technical session 3 – AI approaches for Automotive Systems’ Safety
Moderator: Nir Maor, Qualcomm (US) On-Line Learning Driven Adaptation to Subsystem Failures in Autonomous Vehicles Chandramouli Amarnath, Md Imran Momtaz and Abhijit Chatterjee Georgia Institute of Technology, US A Methodology to use AI for Automotive Safety using Model Explainability Srikanth Kaniyanoor Srinivasan, Krishna V and Harsha Vardhan Sahoo Intel Technology, India An Approach for Managing Resources Used by Cyber-Physical Systems in a Multi-Cloud Environment Vlad Bucur and Liviu Miclea Technical University of Cluj-Napoca In-Field Reliability Monitoring of Mission-Critical Automotive Electronics based on Deep Data Andrea Matteucci, Nir Sever and Gal Carmel proteanTecs, IT and IS
2:50 PM – 3:00 PM (PT time)
Closing session