The ART workshop focuses exclusively on test and reliability of automotive and mission-critical electronics, including design, manufacturing, burn-in, system-level integration and in-field test, diagnosis and repair solutions, as well as architectures and methods for reliable and safe operations under different environmental conditions. With increasing system complexity, security, stringent runtime requirements for functional safety, and cost constraints of a mass market, the reliable operation of electronics in safety-critical domains is still a major challenge. This edition of the ART Workshop offers a forum to present and discuss these challenges and emerging solutions among researchers and practitioners alike.
ART will take place in conjunction with the IEEE International Test Conference (ITC) and is sponsored by the Test Technology Technical Council (TTTC) of IEEE Computer Society.
You are invited to participate and submit your contributions to the ART Workshop. The workshop’s areas of interest include (but are not limited to) the following topics:
- Functional safety and security in the automotive domain
- Automotive standards and certification – ISO 26262
- Approximate computing and Artificial Intelligence
- Multi-layer dependability evaluation
- Verification and validation of automotive systems
- Fault tolerance and self-checking circuits
- Aging effects on automotive electronics
- Resiliency by application
- Dependability challenges of autonomous driving and e-mobility
- Power-up, power-down and periodic test
- System level test
- Reuse of test infrastructure
- Functional and structural test generation
- High quality volume test- minimizing DPPM
- Life cycle test cost minimization