4th IEEE Workshop on AI Hardware: Test, reliability and Security (AI-TREATS)

The Hague, Netherlands, May 23-24, 2024

AI-TREATS24 Program

The program is available in PDF here

All times are CET

Thursday, May 23, 2024

Opening
16:30-16:35  

Annachiara Ruospo (Politecnico di Torino, Italy)
Haralampos Stratigopoulos (Sorbonne Université, CNRS, LIP6, France)
Keynote
16:35-17:30

How does one bit-flip corrupt an entire deep neural network, and what to do about it
Yanjing Li (University of Chicago, USA)
Panel
17:30-18:30

Networks of Excellence on Edge AI in Europe
 
Moderator: Ihsen Alouani  (Queen’s University Belfast, UK)

Panelists:
-Alain Pagani (German Research Center for Artificial Intelligence, Germany) – dAIEDGE project
-Matteo Sonza Reorda (Politecnico di Torino, Italy) – FAIR project
-Ovidiu Vermesan, (SINTEF, Norway) – EdgeAI project
 
Welcome Reception 18:30

Friday, May 24, 2024

Session 1
8:30-10:10
 
High-Level Synthesis Effects on ANN Hardware Accelerator Reliability: Balancing Performance and Failure Rates (Invited)
Angeliki Kritikakou, Marcello Traiola, Fernando Fernandes Dos Santos (University of Rennes, INRIA, IRISA, France)

Exploring Hybrid Techniques for the Reliability Evaluation of TCUs
Robert Limas Sierra, Juan Guerrero, Josie Esteban Rodriguez Condia and Matteo Sonza Reorda (Politecnico di Torino, Italy)
 
Functional Fault Characterization and Propagation on Systolic Arrays
Salvatore Pappalardo (École Centrale de Lyon, INL, France), Alberto Bosio (École Centrale de Lyon, INL, France) and Bastien Deveautour (CPE Lyon, France)
 
Vulnerability Analysis of Early-Exit DNNs using hardware-aware software-level fault models
Georgios Konstantinidis, Maria Michael and Theocharis Theocharides (University of Cyprus/KIOS Research and Innovation Centre of Excellence, Cyprus)
 
Cost-Effective Fault Tolerance for CNNs Using Parameter Vulnerability Based Hardening and Pruning
Mohmmad Hasan Ahmadilivani (Tallinn University of Technology, Estonia), Seyedhamidreza Mousavi (Mälardalen University, Sweden), Jaan Raik (Tallinn University of Technology, Estonia), Masoud Daneshtalab (Mälardalen University, Sweden) and Maksim Jenihhin (Tallinn University of Technology, Estonia)
Session 2
10:10-11:10

CLASSES: An Open-Source Cross-Layer Error Simulation for CNNs Against Soft Errors (Invited)                                                                                                             
Antonio Rosario Miele (Politecnico di Milano, Italy)

A Fault Injection Framework for Spiking Neural Networks
Theofilos Spyrou (TU Delft, The Netherlands) and Haralampos-G. Stratigopoulos (Sorbonne Université, CNRS, LIP6, France)
 
SpikingJET: Enhancing Fault Injection for Fully and Convolutional Spiking Neural Networks
Anil Bayram Gogebakan, Enrico Magliano, Alessio Carpegna, Annachiara Ruospo, Alessandro Savino and Stefano Di Carlo (Politecnico di Torino, Italy)

Coffee Break 11:10-11:30
Session 3
11:30 – 12:30

AI Accelerator Testing Gaps  (Invited)
Moritz Fieback (TU Delft, The Netherlands)
 
Test Vector Compression for the Functional Testing of AI Accelerators  (Invited)
Soyed Tuhin Ahmed (Chair of Dependable Nano Computing (CDNC) at KIT – Karlsruhe Institute of Technology, Karlsruhe, Germany)

Advanced Testing Techniques for AI Chips
Lee Harrison (Siemens, UK)

Lunch break 12:30-14:00
Session 4
14:00 – 14:40

The Green Shield:  Sustainable Hardware for Secure AI  (Invited)                   
Ihsen Alouani (Queen’s University Belfast, UK)
 
Security issues of Ultra-Low-Power Open-Source Hardware running tinyML applications
Antonio Porsia, Annachiara Ruospo and Ernesto Sanchez (Politecnico di Torino, Italy)
Session 5
14:40-15:20

Temperature-compensation of resistive in-memory-computing chips: a system perspective
Dipesh Monga (Aalto University, Finland), Gaurav Singh (Aalto University, Finland), Omar Nael Numan (Aalto University, Finland), Kari Halonen (Aalto University, Finland) and Martin Andraud (UCLouvain, Belgium)
 
Fully Reconfigurable AI Processing System
Rizwan Tariq Syed, Marko Andjelkovic, Markus Ulbricht and Milos Krstic (IHP, Leibniz-Institut für innovative Mikroelektronik, Germany)
Closing
15:20-15:30   

Annachiara Ruospo (Politecnico di Torino, Italy)
Haralampos Stratigopoulos (Sorbonne Université, CNRS, LIP6, France)